CAM-Workshop - April 25th and 26th, 2018
Innovation in Failure Analysis and Material Diagnostics of Electronics Components

Save the date: the next CAM workshop will take place on 25th and 26th April 2018

We are in the planning process for the program and will inform you as soon as possible.

Join us: 7th CAM workshop in April 2018

It is a special pleasure to announce the 7th CAM workshop which will this time focus on “Failure Analysis and Material Diagnostics of Electronics Components”. The workshop will take place in Halle (Saale), Germany on 25th and 26th April 2018. Since starting this series of workshops in 2012, the event has established itself as an international meeting place for the community working on industrial failure diagnostics and material characterization of electronics components.

We concentrate on questions like how to find, control and avoid defects; how to analyze and understand material interactions and as the final target, how to improve the quality and reliability properties of semiconductor components and systems. There is no doubt, that the workshop’s topics, which focus mainly on practical issues, have been gaining momentum and this practical approach looks to be even more important in future.

This trend is fueled by requirements arising from IC shrink, the increasing design complexity of homogenously or heterogeneously integrated electronics systems and the continuous introduction of more and more new materials, for example wide bandgap semiconductors. In addition, these cutting-edge semiconductor technologies have to meet the quality standards of reliability-demanding applications much more rapidly, in particular those of the fast evolving automotive electronics market.

Thus, both experts from the electronics industry and from material diagnostics equipment manufacturers will meet in Halle in order to discuss current and future needs in defect analysis and material characterization from the technology perspective; for sharing current results in failure analysis application studies. Furthermore, the experts will also present the latest achievements in newly developed innovative diagnostics methods, instrumentation and tools. As in the past, the workshop will be organized by Fraunhofer IMWS, the Center of Applied Microstructure Diagnostics in particular, in cooperation with EUFANET and will be supported by the program committee made up of experts from leading semiconductor industry and research institutes. The program of invited oral presentations will also be accompanied by an industrial exhibition of failure analysis and material diagnostics equipment suppliers.

On behalf of the organization committee, it is my pleasure to invite you to join us in Halle in April 2018.

Matthias Petzold