ELITE USER-WORKSHOP

For the past years, the usage of LIT (Lock-In Thermography) among European laboratories have grown considerably. In order to improve the experience sharing around this valuable Failure Analysis technique, Sector Technologies and ThermoFisher Scientific organize a technical meeting among the ELITE users.

The meeting will take place on Tuesday April 24th 2018 at Fraunhofer CAM, Heideallee 19, 06120 Halle.

 

Agenda:

• 9:00 – 9:30 => Welcome, registration and coffee

• 9:30 – 10:10 => A. REVERDY / Y. PFEFER (Sector Technologies)

 

“ELITE Product Update”

• 10:10 – 10:30 => Morgan MOUSNIER (CNES, French Space Agency)

 

“3D localization with IR Thermography : Pulsed Thermography & Ultrasound coupling”

• 10:30 – 11:00 => Coffee break

• 11:00 – 11:40 => Holger HERZOG (GLOBALFOUNDRIES)

 

“ELITE – Closing the gap beyond PEM and OBIRCh”

• 11:40 – 12:00 => Denis BLACHIER (CEA LETI)

 

“Impact of the interface on the quality of cooling”

• 12:00 – 13:30 => Lunch break

• 13:30 – 14:00 => S. BRAND (Fraunhofer Inst. Halle),

 

“Time-resolved lock-in thermography for defect localization in 3D”

• 14 :30 – 15:00 => Thijs Kempers (Maser Eng.)

 

“Lock-In Thermography showcases”

• 15:00 – 15:40: => Antoine REVERDY (Sector Technologies) on behalf of Kunihiko OOUCHI (Sanken Electric Co.)

 

“A Study of Localization of logic device Localization Having open defect Using lock -in thermography”

• 15:40 – 16:00 => Round table and discussions

 

You can also download the program here.

 

For more information, please contact Antoine Reverdy or Yvan Pfefer.