ELITE USER-WORKSHOP

For the last decade, the usage of LIT (Lock-In Thermography) among European laboratories have grown considerably and you are the evidence of it! In order to improve the experience sharing around this valuable Failure Analysis technique, Sector Technologies and ThermoFisher Scientific would like to setup a technical meeting among the ELITE users community.

Based on the good experience we had during the three first European ELITE Users Meetings (2015/2017/2018), we are pleased to organize our fourth session, the day before the 2019 Fraunhofer CAM workshop event in Halle.

 

4th European ELITE Users Group Meeting in Halle Tuesday April 9th 2019, 12am to 5pm

Agenda:

• 12:00 – 13:00 => Welcome, registration and Lunch

• 13:00 – 13:40 => Brian LAI / Yvan PFEFER (ThermoFisher Scientific / Sector Technologies)
“ELITE Product Update and roadmap”

• 13:40 – 14:00 => Brain LAI, Bernice ZEE (ThermoFisher Scientific, Advanced Micro Devices)
“Improved Phase Data Acquisition for Thermal Emissions Analysis of 2.5D IC” Presented at ISTFA 2018

• 14:00 – 14:15 => Bernice ZEE (Advanced Micro Devices)
“Lock In thermography use case discussion”

• 14:15 – 14:45 => Sebastian BRAND (Fraunhofer Institute Halle),
“Arbitrary waveform stimulation and TRTR analysis for advanced 3D LIT inspection”

• 14:45 – 15:15 => Coffee Break

15:15 – 15:45 => Brian LAI (ThermoFisher Scientific)
“Lock in thermography use cases on power devices”

• 15:45 – 16:10 => Brian LAI (ThermoFisher Scientific) on behalf of NXP Nijmegen
“ELITE evaluation use cases”

• 16:10 – 16:30 => Brian LAI (ThermoFisher Scientific)
• “Absolute temperature mapping with ELITE”

• 16:30 – 17:00 => Round table, Conclusions

 

For more information, please contact Antoine Reverdy or Yvan Pfefer.