Please click on the respective exhibitor button below for more information.
Booth 1: JIACO Instruments
JIACO Instrument’s atmospheric Microwave-Induced-Plasma decapsulation is the new standard for Failure Analysis & Reliability Testing. The fully automated process is highly selective; critical failure sites in advanced packages e.g. SiP, WCLSP, 3D are retained without process-induced damage to challenging materials e.g. Ag, Cu bond wire, GaAs, Cu-RDL, BOAC.
The JIACO Instruments system has been in the market since mid-2016 and is now in use by many renown global companies to solve their most complex decapsulation challenges in Failure Analysis & Reliability Testing. At the CAM-Workshop 2020 JIACO Instruments will be at booth 1.
We look forward to speaking with you!
Booth 2: MASER Engineering
MASER Engineering is an independent engineering service company. Since 1993 we have offered Reliability Test and Failure Analysis Services to the semiconductor and electronic systems industry.
Whether your company is active as Fabless Semiconductor Manufacturer, IC Design House, Electronic Manufacturing Service (EMS) Provider or Original Equipment Manufacturer (OEM) we can support you with your daily Reliability Test or Failure Analysis challenges.
Maintaining and improving our quality level is one of our strengths. Since June 2000 we are ISO9001:2015 certified. In September 2005 we proudly became the first company in the Netherlands with an ISO/IEC 17025:2005 accreditation for reliability tests and analysis of electronic components and electronic (sub)systems.
Booth 3: Quantum Design GmbH
Quantum Design GmbH in Darmstadt is the European headquarters of one of the most powerful European distributors of high-tech instrumentation for scientific, academic and industrial research. We offer components and leading edge systems with applications in materials characterization, particle size and thin film analysis, special cameras and imaging, electron microscopy, spectroscopy, photonics and bio- and nanotechnology. We will present at CAM workshop the following topics:
- EM sample preparation
- Correlative AFM/SEM/FIB analysis
- In-situ TEM
- X-Ray analysis systems
- In-situ stages for SEM and µCT
Booth 4: point electronic GmbH
point electronic GmbH is an independent supplier of detectors, acquisition and control systems for SEM, TEM and Micro-analysers. The company is an established leader in development of custom microscopes and techniques, such as Topography, EBIC and EBAC/RCI, and is a leading supplier of custom inspection microscopes and electrical failure analysis instrumentation. point electronic GmbH also provides a wide range of services for standard microscopes, up to complete electronics and software upgrades. The company operates since 1997 and is based in Halle (Saale), Germany.
Booth 5: Kleindiek Nanotechnik
Kleindiek Nanotechnik provides state-of-the-art nanoprobing and failure analysis solutions for addressing all technology nodes from largest to smallest. Our micro- and nanomanipulators provide a high degree of flexibility, ease-of-use, and stability. The suite of Advanced Probing Tools including the Live Contact Tester, EBIC/EBAC/EBIRCH system, as well as our intuitive iProbe control software, a wide variety of fault localisation and failure analysis tasks and workflows can be addressed at varying temperatures down to -55°C. In addition, micromanipulators for in situ TEM sample lift out – including back side and other preparation options are available.
Booth 6: XYXZTEC bv
Booth 7: IONTOF GmbH
IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS).
Founded as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation
The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80’s. Since the technique became commercially viable IONTOF has made many product improvements and more than 280 instruments are in operation in industrial and academic laboratories worldwide.
Booth 8: Sector Technologies
SECTOR TECHNOLOGIES is a distributor Company for high-tech products within European Semiconductor Industry . Our focus is mainly the distribution of failure analysis high-end equipment.
The acceleration of new technology introduction requires new tools for failure analysis adapted to the technology challenges.
Lock-in Thermography ( Elite), EMMI and laser scanning microscopy application (Meridian family) and nanoprobing ( nProber III, Flexprober, Hyperion) from ThermoFisher are products specifically targeted for process development, yield improvement , failure analysis for complex electronics components .
Samples preparation and backside silicon thinning has also become a significant challenge; varioMill from Varioscale allows outstanding automated backside preparation on single die and stacked dies assembly, decapsulation of all types of packages with JetEtch Total Protect from Nisene and Decap10/20 laser decap from Lray.
We also have products to present in the test and debug area Mutest: mixed signal test; Teseda: device bring up, scan chain debug, Focused Test: MOSFet, GAN test. Test analysis software for small lots (GAT) , probing station (SEMICS) .
Visit us on our booth .
Booth 9: Allied High Tech Products, Inc.
Booth 10: InfraTec GmbH
Dresden based InfraTec GmbH Infrarotsensorik und Messtechnik was founded in 1991. The German company employs more than 200 employee and has its own design, manufacturing and distribution capabilities. InfraTec’s Infrared Measurement division is one of the leading suppliers of commercial thermal imaging technology. Beside high-end camera series ImageIR® and the VarioCAM® High Definition product family, the company offers turnkey thermographic automation solutions, e.g. automated Lock-in thermographic test benches for microscopic failure inspection of electronics. Smallest defects like point and line shunts, oxide failures, transistor and diode failures can be detected in 2D and 3D.
Booth 11: SmarAct GmbH
SmarAct develops, manufactures and sells positioning and handling systems in the nanometer range. Our product portfolio extends from single-stage-solutions to complex serial or parallel kinematics, miniaturized manipulators and user-friendly control systems. It is complemented by sophisticated metrology devices based on laser interferometers.
At the CAM Workshop 2020, SmarAct will introduce the new SMARPROBE, based on our most advanced motion system- and controller- generation. It is especially refined for the highest demanding nanoprobing tasks. The cutting-edge precision of SmarAct systems enables probing even on the smallest semiconductor technology nodes and is compatible with a variety of FIBs, SEMs and optical microscopes.
Booth 12: John P. Kummer GmbH
The John P. Kummer GmbH is a specialist European Distributor of instruments and consumables mainly for the Semiconductor industry, but also for the Medical Device, Aerospace, Solar and related Industries. We attach great importance to trade with reliable products. We verify the quality of the manufacture of the products sold by us regularly. Our employees are trained in continuous intervals of our suppliers and maintain them with an intensive exchange of information.
Using our long established relationships within these industries worldwide, we bring the newest and most technologically advanced products in their fields to the European market.
Booth 13: Hamamatsu Photonics Deutschland GmbH
Hamamatsu Photonics is a worldwide leading manufacturer of opto-electronic components and systems. Among others we offer sensors and systems for spectroscopy including ultra fast, scientific-grade cameras, beam monitoring solutions, photon counting detectors, photodiodes, photomultipliers and IR detectors.
At the CAM Workshop we show our systems for failure localization on integrated circuits based on emission microscopy (EMMI), laser based techniques (OBIRCH, OBIC, SDL, EOP) and lock-in thermography (LIT).
Booth 14: Schaefer Technologie GmbH
Schaefer Technologie GmbH is part of the Schaefer-Tec group, an established distribution and consulting company for scientific instrumentation. Product categories include optical and mechanical surface profiling, scanning probe and electron microscopy, nanomechanical testing, and nanomanipulation/nanoprobing. The NenoVision LiteScope allows to acquire SEM and AFM data in the same scan for true correlated probe and electron microscopy. For Nano-And Microindentation, KLA brings together the former Keysight – and former Nanomechanics Inc. Products for in-situ or ex-situ testing. The Imina miBots are available for probing and manipulation tasks under optical microscopes or inside SEMs.
Booth 15: 3D-Micromac AG
3D-Micromac is the leading specialist in laser micromachining. We develop processes and systems at the highest technical and technological level.
3D-Micromac’s microPREP™ PRO enables laser-based sample preparation of metals, semiconductors, ceramics, polymer, and compound materials. The system can be used for a variety of sample preparation applications such as SEM, TEM, XRM, APT, and micromechanics.
microPREP™ PRO complements existing approaches to sample preparation such as ion-beam processing and creates new vistas for sample preparation. It allows the creation of complex and 3D-shaped samples. Thus, it enables more comprehensive analysis of certain structures like in advanced packages (TSVs, SiP).
Booth 16: bsw TestSystems & Consulting AG
At CAM-Workshop bsw shows solutions from Microsanj, a USA based company. It is all about Thermal Visualization systems typically used to examine the temperature distribution over semiconductor device structures (Transistors, Diodes, LED’s, MEMS, Lasers, …). This is done with use of either IR (infra-red) light or the Thermo-Reflectance principle, both in a ‘lock-in’ measurement fashion. Because the latter uses visible light from fast LED’s or Lasers, it is possible to distinguish temperature differences as close as 100nm apart (spatial resolution) and view heat-up curves in time steps of <100ns resp. <100ps (time resolution). Microsanj/bsw TestSystems & Consulting also deliver measurement services and application oriented consulting in the area of IR and Thermo-Reflectance analysis.
Booth 17: PVA TePla Analytical Systems GmbH
PVA TePla Analytical Systems designs and manufactures state of the art Scanning Acoustic Microscopes. Technological developments have focused on the detection of structural defects and materials characterization within opaque materials. Scanning Acoustic Microscope (SAM) utilizes ultrasound to non-destructively examine surfaces and internal structures of a solid sample. Voids, inclusions, cracks and even density variations are all defects sensitive to the technique of acoustic microscopy. PVA TePla operates an international sales and service network with own application laboratories in the US, Japan, Singapore and Malaysia. We cooperate with a large number of university facilities, such as Frauenhofer Institut and IMEC and semi-conductor companies from all over the world.
Booth 18: Intraspec Technologies
At Intraspec we provide MAGMA systems, the most advanced magnetic imaging tool to localize currents in packages and dies, allowing extremely precise 3D localization of all static defects, from short circuits, resistive opens and complete open circuits!
At Intraspec we also perform Failure Analysis and Reliability studies for electronic components and assemblies, by using cutting edge technologies from defect localization to physical analysis.
Booth 19: Park Systems Euope GmbH
Park Systems provides high-performance atomic force microscopes (AFM) for research and industrial communities to explore new phenomena in chemistry, materials, physics, life sciences, semiconductor and data storage industries. Cutting-edge AFM automation and the highest data accuracy delivers innovative AFM application solutions for material sciences, in particular for investigating electrical and nanomechanical properties of materials at the nanoscale.
During the workshop we will showcase the AFM technological solutions for the nanocharacterization of Semiconductors and Electrical Devices. Join us to discuss the great range of nanoscale measurements for Semiconductor Failure Analysis, defect testing in Electrical Devices, Electrical Characterization of Semiconductor Devices, and other nanoscale solutions for of nanomechanical, magnetic and electrical material characterization.
Booth 20: MUEGGE GmbH
MUEGGE is the leading international manufacturer and provider of plasma source technologies, industrial microwave heating systems and the related components.
The MUEGGE – R3T plasma decapsulation tools have been especially developed for the fast etching of mould compound and polyimide to open microchips without attacking the sensitive wiring. The patented Rapid Reactive Radical Technology (R3T), introduced by the Remote Plasma Source (RPS), provides the capability for fast decapsulation of microchips with high selectivity and no attack on metals.
Booth 21: Intego GmbH
INTEGO GmbH is a medium-sized technology company located in Erlangen, Germany.INTEGO develops and produces customized optical and thermographic inspection systems for production and laboratory. Recently, INTEGO has developed SPICA, a highly sensitive inspection system based on Lock-in IR Thermography particularly for the failure analysis in electronic devices. SPICA systems are offered in different system designs, starting with cost effective table-top systems, over semi-automatic systems for laboratory use up to fully automated inline systems, suitable for integration in a high-volume production line. The spatial resolution can be adapted to fit specific needs.