Please click on the respective exhibitor button below for more information.
Booth 1: DIGIT CONCEPT SA
DC has been helping FA/QA for 30 years now and is one of the leading suppliers of commercial IC Decapsulation, Cross Sectioning and PCB Cut tools.
We design and manufacture state of the art equipments and this year we will show the newest ones:
- SesamePLASMA : iMIP™ release 2022
- SesameMICROMACHINING™ LASER : used before FIB
(Both have been developed during SAM3 European Project)
We will be happy to present you on our booth the last release of:
- SesameLASER : SLP500
- SesameACID : iSA777
- SesameMECHANICAL : ASAP-1 Up-Grade
As always with DC you can UP-GRADE or TRADE-IN your old equipment with iPanel™
Have a fruitful CAM-WORSHOP with DC.
Booth 2: point electronic GmbH / IMINA Technologies SA
point electronic GmbH is an independent supplier of detectors, acquisition and control systems for SEM, TEM and Micro-analysers. The company is an established leader in development of custom microscopes and techniques, such as Topography, EBIC and EBAC/RCI, and is a leading supplier of custom inspection microscopes and electrical failure analysis instrumentation. point electronic GmbH also provides a wide range of services for standard microscopes, up to complete electronics and software upgrades. The company operates since 1992 and is based in Halle (Saale), Germany.
Imina Technologies is a Swiss manufacturer of robotic solutions for electrical characterization of samples under optical and scanning electron microscopes. Its cutting-edge products and high-quality services position the company as one of the leaders in the semiconductor test equipment market for nanoprobing and electrical failure analysis.
Booth 3: Schaefer Technologie GmbH
Schaefer Technologie GmbH is an established distribution and consulting company for scientific instrumentation. Product categories include optical and mechanical surface profiling, scanning probe and electron microscopy, nanomechanical testing and nanoprobing.The KLA Tencor /AlphaStep Stylus profilometers offer tactile step height – or roughness testing as well as stress/bow testing of wafers. For Nano-and Micro-Indentation, KLA produces solutions for in-situ or ex-situ mechanical testing. The Imina miBots are available for high resolution positioning and electrical probing in optical microscopes or SEMs. The TechnoOrg Linda ion mills can be proposed for SEM/EBSD or TEM sample preparation
Booth 4: JIACO Instruments
JIACO Instruments Microwave Induced Plasma decapsulation is the new standard for reliable Reliability Test & Failure Analysis. The fully automated decapsulation process is highly selective; critical failure sites in advanced packages (SiP, WLCSP, 2.5D, 3D) are retained without process induced damage to challenging materials such as Ag, Cu bond wire, GaAs, Cu RDL, BOAC.
The JIACO Instruments MIP system has been in the market since mid-2016 and is now in use by many renown global companies for reliable failure analysis and quality control.
Booth 5: InfraTec GmbH Infrarotsensorik und Messtechnik
InfraTec’s Infrared Measurement Division is one of the leading suppliers of commercial thermal imaging technology for thermographic temperature measurement. The wide range of high-performance cameras like its ImageIR® series together with InfraTec’s efficient and convenient thermographic software IRBIS® will make electronics testing also at a µm scale fast and precise. Additional lock-in routines allow for the detection of failures resulting only in smallest thermal differences in the µK range. The fully integrated solution E-LIT will most effectively run complex testing routines of PCB, chips or components based on specific customer demands.
Booth 6: Allied High Tech Products, Inc
For over 39 years, Allied High Tech Products has provided sample preparation products for failure analysis to the microelectronics industry. Allied manufactures cutting-edge equipment at its facilities with all design, manufacturing and assembly taking place in-house to ensure the highest quality equipment is produced. Allied\’s state-of-the-art equipment includes the X-Prep® Precision Polishing/Grinding/Milling Machine, MultiPrep™ Polishing System, MetPrep Grinding/Polishing Systems and TechCut™ Sectioning Saws. Please stop by Stand #6 for more in-depth information.
Booth 7: JP Kummer Semiconductor Technology GmbH
The JP Kummer Semiconductor Technology GmbH is a specialist European Distributor of instruments and consumables mainly for the Semiconductor industry, but also for the Medical Device, Aerospace, Solar and related Industries. We attach great importance to trade with reliable products. We verify the quality of the manufacture of the products sold by us regularly. Our employees are trained in continuous intervals of our suppliers and maintain them with an intensive exchange of information. Using our long established relationships within these industries worldwide, we bring the newest and most technologically advanced products in their fields to the European market.
Booth 8: 3D-Micromac AG
microPREP™ PRO is 3D-Micromac‘s laser-based sample preparation system that provides smart sample preparation processes for a variety of specimen preparation applications. With its integrated ultrashort pulsed laser source, the microPREP™ PRO complements existing approaches to sample preparation such as ion beam processing, x-CT, and microscopic analysis of any kind.
microPREP™ PRO is suited to ablate metals, semiconductors, ceramics, polymers, and compound materials. It creates new vistas for material and process development as well as failure analysis.
Booth 9: Kleindiek Nanotechnik
Kleindiek Nanotechnik specializes in extremely compact, ultra-precise nanopositioning systems. These Systems are customized for FIB/SEM applications ranging from TEM sample preparation all the way to nanoprobing for failure analysis and fault isolation performed either in FIB/SEM or SEM while employing very low beam acceleration voltages, if necessary. Our nanoprobing solutions are validated on 5 nm node technology and ready for shrinking device sizes coming in the near future. The nanoprobing systems are complemented by a host of analysis and visualization tools integrated into a unified UI. These include EBIC/EBAC etc. as well as current leakage detection, and transistor characterization.
Booth 10: Eurofins MASER B.V.
Eurofins MASER is an independent engineering service provider for Reliability Test and Failure Analysis of micro-electronic components and systems. We offer advanced facilities for Integrated Device Manufacturers, Fabless and Labless IC manufacturers as well as the Original Equipment Manufacturing companies in our main lab in Enschede, The Netherlands.
Booth 11: Sector Technologies
SECTOR TECHNOLOGIES is a distributor for high-tech products within European Semiconductor Industry . Our focus is the distribution of failure analysis high-end equipment.
New technology introduction requires new tools for failure analysis adapted to the challenges:
Lock-in Thermography ( Elite), EMMI and laser scanning microscopy application (Meridian family) and nanoprobing ( nProber IV, Hyperion) from ThermoFisher are products specifically targeted for process development, yield improvement , failure analysis for complex electronics components
For samples preparation and backside SI thinning we have an extended offer : JetEtch, PlasmaEtch and VarioMill
For electrical test : Mutest , Teseda
Lamartine 263 / 38320 Eybens (FR)
+33 619565 386
Booth 12: SmarAct GmbH
SmarAct Metrology develops, manufactures and distributes products in the field of optical and electrical metrology. These products include interferometer, vibrometer and nanoprober as well as customized metrology solutions. The SMARPROBE Nanoprober is a result of joined forces with our partner company SmarAct, one of the leading companies in the development and production of high-quality positioning systems in the nanometer range.The SMARPROBE allows the positioning of up to eight probes to analyze or manipulate samples fixed onto its sample stage. The closed-loop control of the probes and the sample allows automated and stable positioning as well as assistance from CAD navigation.
Booth 13: PVA TePla Analytical Systems GmbH
Acoustic Microscopy / Made in Germany
PVA TePla Analytical Systems GmbH has been a ground-breaking expert in the field of acoustic microscopy for more than 30 years. With a range of leading solutions to suit all industries and fields of technology, we enable our customers to perform reliable non-destructive materials testing—from the inspection of solar and semiconductor systems all the way to failure analyses for ingots used in the production of wafers and MEMS systems
Booth 14: Muegge GmbH
MUEGGE is the leading international manufacturer of industrial microwave and plasma equipment.
The MUEGGE – R3T plasma decapsulation tools have been especially developed for the fast etching of mould compound and polyimide to open microchips without attacking the sensitive wiring. The patented Rapid Reactive Radical Technology (R3T), introduced by the Remote Plasma Source (RPS), provides the capability for fast decapsulation of microchips with high selectivity and no attack on metals.
Booth 15: Quantum Design GmbH
For more than 50 years, Quantum Design Europe has been one of the leading distributors of high-tech systems and components for research and industry. With 120 employees in 20 European countries, we offer the broadest selection with an exciting mix of suppliers from long-established corporations on the one hand and innovative start-up companies on the other.
We will present the following systems at CAM workshop:
– Correlative SEM-AFM analysis with the AFSEM from QD Microscopy
– Breakthrough x-ray analysis systems from Sigray (XRF, XAS, XRM,…)
– In-situ microscopy solutions (force, temperature, liquid,…) from Deben and DENSsolutions
– Sputter & carbon coaters from Quorum
Booth 16: Hamamatsu Photonics Deutschland GmbH
Hamamatsu Photonics is one of a few companies, in the world that develops a wide range of light sensors, such as photodiodes, image sensors and photomultiplier tubes, as well as number of light sources.
Our portfolio of more than 10,000 products does not only include components, but also fully integrated systems, like our new emission microscope PHEMOS X for failure localization in semiconductor devices.
It can be equipped with up to 5 lasers from VIS to NIR for the customized analysis.
Phemos X is prepared for analysis of Logic and Power Devices, including advanced CMOS technologies. Its structure is designed to embed each of those approaches, either individually or \”all at once\”.
Booth 17: Protochips EMEA GmbH
Protochips empowers scientists, engineers, and researchers to discover and analyze new phenomenon by visualizing a wide range of TEM samples and processes in completely new ways. Performance is redefined with the removal of specimen drift; Productivity is enhanced by reducing the learning curve for complicated experiments; and Discovery is enabled through a new metadata indexing method that makes all information easily sharable using our open-access AXON Studio product. Combined with our range of in-situ solutions or used simply during traditional electron microscopy, Protochips is enabling a brand new way to generate actionable data and accelerate discovery.
A range of in-situ solutions is available specifically for electrical characterization of specimen, applied in many labs in the semiconductor industry.