See how EBIC/EBAC and related EFI methods are performed in SEM by attending this short demonstration:
Through the use of electrical probes integrated into an SEM, the location of faults within a device can be identified. Employing micromanipulators with encoded axes yields fast, automatic transitions between the probes’ parked, standby, and working positions. The probes can be employed to perform electrical measurements in order to elucidate the root cause for any underlying issues.
There is also the need to determine whether applying temperatures outside standard lab conditions will affect the devices’ performance or even induce faults. To this end, a small, versatile heating and cooling stage that can be used in conjunction with the in situ probing setup will be demonstrated.
Join us for this quick walkthrough of an EFI workflow. We look forward to seeing you in Halle!