After two successful editions in 2016 and 2018, Imina Technologies SA and point electronic GmbH are joining their forces again to organize their 3rd Nanoprobing and EFA workshop in Halle. This practical workshop will be held on the 29th of April for failure analysis engineers and microscopists wishing an introduction or review of Advanced Nanoprobing and Electrical Failure Analysis (EFA) in SEM, FIB/Dual Beams and TEM. It will be held at the Fraunhofer IMWS.
Lunch will be offered at the beginning of the event and will be followed by presentations in which Nanoprobing, Electron Beam Absorbed Current (EBAC), Resistive Contrast Imaging (RCI) and Electron Beam Induced (EBIC) techniques will be introduced, as well as the more advanced Scanning Transmission EBIC and Lock-In Amplification techniques among others.
After a coffee break, the workshop will focus on hands-on demo sessions with the latest generation equipment. New developments in hardware and software will be showcased, and various options and features will be discussed.
The final program will be shared with all participants by beginning of April 2020.